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Energy Dispersive X-ray Fluorescence Analyzer

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Energy Dispersive X-ray Fluorescence Analyzer
Energy Dispersive X-ray Fluorescence AnalyzerEnergy Dispersive X-ray Fluorescence Analyzer
Analytical › Elemental Analysis

Energy Dispersive X-ray Fluorescence Analyzer

The Energy Dispersive X-ray Fluorescence Analyzer (EDXRF) is a non-destructive elemental analysis instrument based on the principle of X-ray fluorescence.

Category: Analytical › Elemental Analysis108 views
Product DetailsDETAILS

Product Introduction

The Energy-Dispersive X-ray Fluorescence (EDXRF) analyzer is a non-destructive elemental analysis instrument based on the principle of X-ray fluorescence. The instrument irradiates the sample with an X-ray tube; atoms in the sample are excited and emit characteristic fluorescent X-rays. An energy-dispersive detector (typically a silicon drift detector, SDD) then resolves the energy and intensity of each element, enabling qualitative, semi-quantitative, and quantitative elemental analysis of the sample. It is widely used for RoHS/halogen-free screening in the electrical and electronics industry, composition analysis of alloys and precious metals, coating thickness and composition analysis, and elemental inspection in fields such as minerals and building materials.

Main Technical Parameters

  • Analysis principle: Energy-dispersive X-ray fluorescence spectrometry (EDXRF), non-destructive inspection
  • Measurable element range: Na (11) to U (92), simultaneous multi-element analysis
  • Content analysis range: 1ppm to 99.99%
  • Detector: High-resolution silicon drift detector (SDD), electrically cooled, no liquid nitrogen required
  • X-ray tube: Micro-focus rhodium (Rh) or molybdenum (Mo) target, depending on configuration
  • High-voltage generator: Up to 50kV, tube current software-adjustable
  • Collimator/filter: Multiple sets with automatic switching, minimum spot size down to 0.2mm
  • Sample form: Solid, powder, liquid, and thin-film samples
  • Sample chamber: Large-capacity sample chamber, accommodates specimens of conventional dimensions
  • Measurement atmosphere: Air/vacuum/helium, depending on configuration
  • Software functions: Fundamental parameter (FP) standardless analysis, spectrum comparison, statistics, and report output
  • Power supply: AC 220V, 50/60Hz

Product Features

  • Non-destructive inspection; no complex sample preparation required
  • Simultaneous multi-element analysis with high speed and simple operation
  • Electrically cooled detector; no routine consumables such as liquid nitrogen required
  • Suitable for RoHS/ELV compliance screening and material composition control
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