Holy Instrument · Suzhou Holy Instrument · Holy InstrumentOptical Inspection Instruments · QA Inspection Instruments · Metallographic Equipment
Hotline0512-65657743中文EnglishMobile13914063216Emailsuzhou@holyinst.com
Hotline0512-65657743
PRODUCT DETAIL

XRF Coating Analyzer

XRF Coating Analyzer
XRF Coating AnalyzerXRF Coating Analyzer
Reliability Test › Coating & Film Thickness Measurement

XRF Coating Analyzer

The XRF Coating Analyzer is a benchtop energy-dispersive X-ray fluorescence spectrometer for coating and elemental analysis.

Product DetailsDETAILS

Product Introduction

The XRF Coating Analyzer is a benchtop energy-dispersive X-ray fluorescence spectrometer that, in addition to measuring coating thickness, can simultaneously analyze the elemental composition of coatings and substrates, achieving simultaneous determination of composition and thickness. The instrument features a downward-looking optical design, ensuring non-contact, non-destructive measurement. Combined with a high-resolution detector and CCD observation positioning, it enables precise measurement of small measurement areas as well as irregular parts such as uneven surfaces, threads and curved surfaces. It is suitable for coating and material analysis in industries such as PCB, electroplating, connectors, semiconductors and precious metals.

Main Technical Specifications

  • Analysis principle: Energy-dispersive X-ray fluorescence (EDXRF), non-destructive, non-contact
  • Elemental analysis range: Mg (12) to U (92), simultaneous analysis of multiple elements
  • Content analysis range: 1ppm to 99.99%
  • Coating thickness measurement: Minimum detection limit for coatings down to 0.005μm, simultaneous analysis of more than 5 coating layers
  • Composition analysis content range: 5ppm to 99.99%
  • X-ray tube: Micro-focus X-ray tube, maximum output voltage 50kV, built-in voltage overload protection
  • Detector: High-resolution electrically cooled Si-Pin detector
  • Multi-channel analyzer: 4096-channel digital pulse processor (DPP)
  • Collimator: Standard Φ0.5mm, optional Φ0.3mm
  • Observation positioning: Built-in high-definition CCD camera, optional motorized stage
  • Software functions: Thin-film FP standardless analysis, qualitative/quantitative analysis, statistical reports
  • Power supply: AC 220V, 50/60Hz

Product Features

  • One instrument simultaneously performs coating thickness and composition analysis
  • Downward-looking integrated design, fast measurement, no sample preparation required
  • Built-in high-definition CCD observation and positioning avoids contact contamination or sample damage
  • Can analyze single-layer, multilayer and alloy coatings as well as plating solutions
DocumentsDOWNLOADS
PDF
Datapaq 六点测温仪 产品资料
1.3 MB · 2026/09/23
Download